Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.4865804
Title: Contactless determination of the carrier mobility sum in silicon wafers using combined photoluminescence and photoconductance measurements
Authors: Hameiri, Z. 
Rougieux, F.
Sinton, R.
Trupke, T.
Issue Date: 2014
Citation: Hameiri, Z., Rougieux, F., Sinton, R., Trupke, T. (2014). Contactless determination of the carrier mobility sum in silicon wafers using combined photoluminescence and photoconductance measurements. Applied Physics Letters 104 (7) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.4865804
Abstract: A contactless method to determine the carrier mobility sum in silicon wafers, based on a comparison between photoluminescence and photoconductance measurements is presented. The method is applied to monocrystalline silicon wafers and the results are found to be in good agreement with well-established mobility models and another measurement method. The potential of the proposed method to determine the carrier mobility sum of multicrystalline and compensated silicon wafers is then demonstrated. © 2014 AIP Publishing LLC.
Source Title: Applied Physics Letters
URI: http://scholarbank.nus.edu.sg/handle/10635/128895
ISSN: 00036951
DOI: 10.1063/1.4865804
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