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|Title:||Contactless determination of the carrier mobility sum in silicon wafers using combined photoluminescence and photoconductance measurements|
|Authors:||Hameiri, Z. |
|Citation:||Hameiri, Z., Rougieux, F., Sinton, R., Trupke, T. (2014). Contactless determination of the carrier mobility sum in silicon wafers using combined photoluminescence and photoconductance measurements. Applied Physics Letters 104 (7) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.4865804|
|Abstract:||A contactless method to determine the carrier mobility sum in silicon wafers, based on a comparison between photoluminescence and photoconductance measurements is presented. The method is applied to monocrystalline silicon wafers and the results are found to be in good agreement with well-established mobility models and another measurement method. The potential of the proposed method to determine the carrier mobility sum of multicrystalline and compensated silicon wafers is then demonstrated. © 2014 AIP Publishing LLC.|
|Source Title:||Applied Physics Letters|
|Appears in Collections:||Staff Publications|
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