Please use this identifier to cite or link to this item:
https://scholarbank.nus.edu.sg/handle/10635/107309
Title: | Study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin film using x-ray scattering and x-ray reflectivity | Authors: | Sun, C.J. Chow, G.M. Wang, J.P. Soo, E.W. Je, J.H. |
Issue Date: | 2002 | Citation: | Sun, C.J.,Chow, G.M.,Wang, J.P.,Soo, E.W.,Je, J.H. (2002). Study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin film using x-ray scattering and x-ray reflectivity. Digests of the Intermag Conference : GS01-. ScholarBank@NUS Repository. | Abstract: | The study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin films using energy dispersive x-ray scattering and x-ray reflectivity was discussed. The average film composition was confirmed using energy dispersive x-ray spectroscopy of scanning electron microscopy. It was found that improved magnetic properties resulted from the combined effects of the higher crystallinity, better texture of CoCrPt (002) and higher interface roughness. | Source Title: | Digests of the Intermag Conference | URI: | http://scholarbank.nus.edu.sg/handle/10635/107309 | ISSN: | 00746843 |
Appears in Collections: | Staff Publications |
Show full item record
Files in This Item:
There are no files associated with this item.
Google ScholarTM
Check
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.