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Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/107309
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dc.titleStudy of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin film using x-ray scattering and x-ray reflectivity
dc.contributor.authorSun, C.J.
dc.contributor.authorChow, G.M.
dc.contributor.authorWang, J.P.
dc.contributor.authorSoo, E.W.
dc.contributor.authorJe, J.H.
dc.date.accessioned2014-10-29T08:42:28Z
dc.date.available2014-10-29T08:42:28Z
dc.date.issued2002
dc.identifier.citationSun, C.J.,Chow, G.M.,Wang, J.P.,Soo, E.W.,Je, J.H. (2002). Study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin film using x-ray scattering and x-ray reflectivity. Digests of the Intermag Conference : GS01-. ScholarBank@NUS Repository.
dc.identifier.issn00746843
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/107309
dc.description.abstractThe study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin films using energy dispersive x-ray scattering and x-ray reflectivity was discussed. The average film composition was confirmed using energy dispersive x-ray spectroscopy of scanning electron microscopy. It was found that improved magnetic properties resulted from the combined effects of the higher crystallinity, better texture of CoCrPt (002) and higher interface roughness.
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentMATERIALS SCIENCE
dc.description.sourcetitleDigests of the Intermag Conference
dc.description.pageGS01-
dc.description.codenDICOD
dc.identifier.isiutNOT_IN_WOS
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