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|Title:||Study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin film using x-ray scattering and x-ray reflectivity|
|Authors:||Sun, C.J. |
|Citation:||Sun, C.J.,Chow, G.M.,Wang, J.P.,Soo, E.W.,Je, J.H. (2002). Study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin film using x-ray scattering and x-ray reflectivity. Digests of the Intermag Conference : GS01-. ScholarBank@NUS Repository.|
|Abstract:||The study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin films using energy dispersive x-ray scattering and x-ray reflectivity was discussed. The average film composition was confirmed using energy dispersive x-ray spectroscopy of scanning electron microscopy. It was found that improved magnetic properties resulted from the combined effects of the higher crystallinity, better texture of CoCrPt (002) and higher interface roughness.|
|Source Title:||Digests of the Intermag Conference|
|Appears in Collections:||Staff Publications|
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