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|Title:||Evidence of lower valence state of vanadium on the dielectric relaxation of ferroelectric SrBi2 (V0.1Nb0.9)2O9||Authors:||Ezhilvalavan, S.
|Issue Date:||21-Sep-2002||Citation:||Ezhilvalavan, S., Xue, J.M., Wang, J. (2002-09-21). Evidence of lower valence state of vanadium on the dielectric relaxation of ferroelectric SrBi2 (V0.1Nb0.9)2O9. Journal of Physics D: Applied Physics 35 (18) : 2254-2259. ScholarBank@NUS Repository. https://doi.org/10.1088/0022-3727/35/18/304||Abstract:||Dielectric properties of SrBi2(V0.1Nb0.9)2O9 (SBVN) were investigated in a broad range of temperatures (400-1000 K) and frequencies (1 Hz to 10 MHz). Strong dielectric relaxation at the ferroelectric transition temperature was observed. The effect of post-sinter annealing on the frequency dispersion of SBVN and the possible mechanisms for the observed dielectric relaxation are presented. Electron paramagnetic resonance and x-ray photoelectron spectroscopy investigations provide direct evidence for the existence of lower valence state of vanadium (V4+) in SBVN ceramics.||Source Title:||Journal of Physics D: Applied Physics||URI:||http://scholarbank.nus.edu.sg/handle/10635/107032||ISSN:||00223727||DOI:||10.1088/0022-3727/35/18/304|
|Appears in Collections:||Staff Publications|
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