Please use this identifier to cite or link to this item: https://doi.org/10.1088/0022-3727/35/18/304
Title: Evidence of lower valence state of vanadium on the dielectric relaxation of ferroelectric SrBi2 (V0.1Nb0.9)2O9
Authors: Ezhilvalavan, S. 
Xue, J.M. 
Wang, J. 
Issue Date: 21-Sep-2002
Citation: Ezhilvalavan, S., Xue, J.M., Wang, J. (2002-09-21). Evidence of lower valence state of vanadium on the dielectric relaxation of ferroelectric SrBi2 (V0.1Nb0.9)2O9. Journal of Physics D: Applied Physics 35 (18) : 2254-2259. ScholarBank@NUS Repository. https://doi.org/10.1088/0022-3727/35/18/304
Abstract: Dielectric properties of SrBi2(V0.1Nb0.9)2O9 (SBVN) were investigated in a broad range of temperatures (400-1000 K) and frequencies (1 Hz to 10 MHz). Strong dielectric relaxation at the ferroelectric transition temperature was observed. The effect of post-sinter annealing on the frequency dispersion of SBVN and the possible mechanisms for the observed dielectric relaxation are presented. Electron paramagnetic resonance and x-ray photoelectron spectroscopy investigations provide direct evidence for the existence of lower valence state of vanadium (V4+) in SBVN ceramics.
Source Title: Journal of Physics D: Applied Physics
URI: http://scholarbank.nus.edu.sg/handle/10635/107032
ISSN: 00223727
DOI: 10.1088/0022-3727/35/18/304
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