Full Name
Joydeep Ghosh
(not current staff)
 
 
Email
elejg@nus.edu.sg
 

Publications

Results 1-6 of 6 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
121-Jun-2022A Simulation Approach to Analyze Bridge-Defects in a 6T-SRAM Bit CellJoydeep Ghosh ; Shang Yi Lim; Ferdaus Md. Meftahul; Senthilnath Jayavelu; Aaron Voon-Yew Thean 
28-Nov-2021Bridge-Defect Prediction in SRAM Circuits Using Random Forest, XGBoost, and LightGBM LearnersJoydeep Ghosh ; Shang Yi Lim; Aaron Voon-Yew Thean 
314-Sep-2022Physical Insights into Vacancy-Based Memtransistors: Toward Power Efficiency, Reliable Operation, and ScalabilitySIVAN MAHESWARI ; LEONG JIN FENG ; JOYDEEP GHOSH ; TANG BAOSHAN ; JIEMING PAN ; Evgeny Zamburg ; THEAN VOON YEW, AARON 
421-Apr-2022Significance of activation functions in developing an online classifier for semiconductor defect detectionMd Meftahul Ferdaus; Bangjian Zhou; Ji Wei Yoon; Kain Lu Low ; Jieming Pan ; Joydeep Ghosh ; Min Wu; Xiaoli Li; Aaron Voon-Yew Thean ; J. Senthilnath
52020Study of Laterally Stacked Nanostructures Using an Organic Semiconducting Channel Fabricated by Trench Isolation TechniqueGhosh, Joydeep ; Salvan, Georgeta; Reuter, Danny
628-Jun-2021Transfer learning-based artificial intelligence-integrated physical modeling to enable failure analysis for 3 nanometer and smaller silicon-based CMOS transistorsJIEMING PAN ; LOW KAIN LU ; JOYDEEP GHOSH ; Senthilnath Jayavelu; Md Meftahul Ferdaus; Shang Yi Lim; Evgeny Zamburg ; Li Yida ; TANG BAOSHAN ; WANG XINGHUA ; LEONG JIN FENG ; Savitha Ramasamy; Tonio Buonassisi; Tham Chen Khong ; THEAN VOON YEW, AARON