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Voon Yew Thean

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Author:  Evgeny Zamburg
Date Issued:  2021
Subject:  failure analysis transistor bridge defect CMOS FinFET GAAFET technology computer-aided design (TCAD) machine learning transfer learning

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Issue DateTitleAuthor(s)
128-Jun-2021Transfer learning-based artificial intelligence-integrated physical modeling to enable failure analysis for 3 nanometer and smaller silicon-based CMOS transistorsJIEMING PAN ; LOW KAIN LU ; JOYDEEP GHOSH ; Senthilnath Jayavelu; Md Meftahul Ferdaus; Shang Yi Lim; Evgeny Zamburg ; Li Yida ; TANG BAOSHAN ; WANG XINGHUA ; LEONG JIN FENG ; Savitha Ramasamy; Tonio Buonassisi; Tham Chen Khong ; THEAN VOON YEW, AARON