Full Name
Shang Huai Min
(not current staff)
Variants
Shang, H.M.
 
Main Affiliation
 
 
Email
mpeshm@nus.edu.sg
 

Publications

Results 121-140 of 150 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
1212001Shearographic NDT of joined surfaces using multiple-frequency sweepHung, Y.Y. ; Shang, H.M. 
2Jan-2000Sheet forming kinematics of curved-textile composites by the mapping schemeLim, T.C. ; Ramakrishna, S. ; Shang, H.M. 
3Mar-1999Sheet forming simulation of knitted fabric composites considering fabric reorientationLim, T.C. ; Fujihara, M.; Zako, M.; Ramakrishna, S. ; Shang, H.M. 
4Aug-1996Singlemode optical fiber electronic speckle pattern interferometryLiu, W.; Tan, Y.; Shang, H.M. 
5Dec-1989Some examples of nondestructive flaw detection by shearographyChau, F.S. ; Toh, S.L. ; Tay, C.J. ; Shang, H.M. 
61-Jan-2000Strain field of deep drawn knitted fabric reinforced thermoplastic composite sheetsLim, T.C. ; Ramakrishna, S. ; Shang, H.M. 
71999Stretch forming analysis of knitted fabric compositesLim, T.C. ; Ramakrishna, S. ; Shang, H.M. 
8Jan-1997Stretching during axisymmetrical forming of sheet metalQin, S. ; Shang, H.M. ; Tay, C.J. ; Mo, J.
92001Study of collimating laser diode beam by a graded-index optical fibreWang, H.; Tay, C.J. ; Quan, C. ; Shang, H.M. 
101-Oct-2001Study on deformation of a microphone membrane using multiple-wavelength interferometryQuan, C. ; Tay, C.J. ; Wang, S.H. ; Shang, H.M. ; Chan, K.C.
112000Surface profiling using shearographyShang, H.M. ; Hung, Y.Y.; Luo, W.D.; Chen, F.
12Jun-2000Surface roughness measurement in the submicrometer range using laser scatteringWang, S.H. ; Quan, C. ; Tay, C.J. ; Shang, H.M. 
13Feb-1998Surface-roughness study using laser speckle methodToh, S.L. ; Shang, H.M. ; Tay, C.J. 
1426-Mar-1998Surface-roughness Study Using Laser Speckle MethodToh, S.L. ; Shang, H.M. ; Tay, C.J. 
15Jun-1998TDI imaging - a tool for profilometry and automated visual inspectionSajan, M.R. ; Tay, C.J. ; Shang, H.M. ; Asundi, A. 
16Sep-1997TDI imaging and scanning moiré for online defect detectionSajan, M.R. ; Tay, C.J. ; Shang, H.M. ; Asundi, A.
117Dec-1986The detection and measurement of symmetric corner cracks by the a.c. field methodShang, H.M. ; Haq, R.; Collins, R.; Michael, D.H.
1182003The Influence of Process Parameters on Forged Magnesium AlloysChan, C.F.; Yong, M.S.; Tay, C.J. ; Shang, H.M. 
1191991The measurement of slope using shearographyTay, C.J. ; Chau, F.S. ; Shang, H.M. ; Shim, V.P.W. ; Toh, S.L. 
120Jul-2001The use of carrier fringes and FFT in holographic nondestructive testingQuan, C. ; Tay, C.J. ; Shang, H.M.