Full Name
Tay Cho Jui
(not current staff)
Variants
Jui, T.C.
Cho, J.T.
Tay, C.-J.
Tay, C.
TAY, CHO JUI
Tay, C.J.
Jui Tay, C.
Tay C.J.
 
Main Affiliation
 
 
Email
mpetaycj@nus.edu.sg
 

Refined By:
Type:  Article
Author:  Tay, C.J.
Department:  MECHANICAL ENGINEERING

Results 81-100 of 189 (Search time: 0.005 seconds).

Issue DateTitleAuthor(s)
8115-Mar-2003In situ surface roughness measurement using a laser scattering methodTay, C.J. ; Wang, S.H. ; Quan, C. ; Shang, H.M. 
21-Sep-2006Inspection of a micro-cantilever's opened and concealed profile using integrated vertical scanning interferometryQuan, C. ; Tay, C.J. ; Li, M.
31-Sep-2000Inspection of micro-cracks on solderball surface using a laser scattering methodQuan, C. ; Wang, S.H. ; Tay, C.J. ; Shang, H.M. ; Chan, K.C.
4Apr-2004Inspection of micro-solderballs on a semiconductor bumped wafer using optical shadowgraphTay, C.J. ; Wang, S.H. ; Quan, C. 
520-Jul-2004Instantaneous velocity displacement and contour measurement by use of shadow moiré and temporal wavelet analysisTay, C.J. ; Quan, C. ; Fu, Y. ; Huang, Y.
61-Nov-2007Instantaneous velocity measurement of dynamic deformation by digital holographic interferometryChen, H.; Quan, C. ; Tay, C.J. 
7May-2004Integrated method for 3-D rigid-body displacement measurement using fringe projectionTay, C.J. ; Quan, C. ; Wu, T.; Huang, Y.H.
81-Oct-2003Integrated optical inspection on surface geometry and refractive index distribution of a microlens arrayQuan, C. ; Wang, S.H. ; Tay, C.J. ; Reading, I.; Fang, Z.P.
9Jun-1997Integrated peak spectral intensity for in situ crack detectionTay, C.J. ; Shang, H.M. ; Sajan, M.R. 
10Aug-2007Investigation of a dual-layer structure using vertical scanning interferometryTay, C.J. ; Quan, C. ; Li, M.
11Mar-2012Investigation of a MEMS piezoelectric energy harvester system with a frequency-widened-bandwidth mechanism introduced by mechanical stoppersLiu, H.; Lee, C. ; Kobayashi, T.; Tay, C.J. ; Quan, C. 
121-Jan-2002Investigation of membrane deformation by a fringe projection methodWang, S. ; Tay, C.J. ; Quan, C. ; Shang, H.M. 
13Aug-2012Investigation of phase error correction for digital sinusoidal phase-shifting fringe projection profilometryMa, S.; Quan, C. ; Zhu, R.; Tay, C.J. 
14May-2000Laser integrated measurement of surface roughness and micro-displacementWang, S.H. ; Tay, C.J. ; Quan, C. ; Shang, H.M. ; Zhou, Z.F.
1515-Jan-2006Lau phase interferometry with a vibrating objectQuan, C. ; Thakur, M. ; Tay, C.J. 
161-Jan-2004Measurement of a fiber-end surface profile by use of phase-shifting laser interferometryWang, S. ; Quan, C. ; Tay, C.J. ; Reading, I.; Fang, Z.
1715-Apr-2004Measurement of a micro-solderball height using a laser projection methodTay, C.J. ; Wang, S.H. ; Quan, C. ; Lee, B.W.; Chan, K.C.
18Mar-2001Measurement of a microphone membrane deflection profile using an optical fibre and wedge fringe projectionTay, C.J. ; Quan, C. ; Wang, S.H. ; Shang, H.M. ; Chan, K.C.
1920-May-2008Measurement of curvature and twist of a deformed object using digital holographyChen, W. ; Quan, C. ; Tay, C.J. 
2015-Apr-2005Measurement of focal length of lens using phase shifting Lau phase interferometryTay, C.J. ; Thakur, M. ; Chen, L.; Shakher, C.