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Quan, Chenggen

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Full Name
Quan, Chenggen
Variants
Chenggen, Q.
Quan, C.G.
Quan, C.
QUAN, CHENGGEN
 
Main Affiliation
 
Faculty
 

Publications

Results 81-100 of 215 (Search time: 0.007 seconds).

Issue DateTitleAuthor(s)
812013HAMR media design in optical and thermal aspectsXu, B.; Cen, Z.; Goh, J.H.; Li, J.; Ye, K.; Zhang, J.; Yang, H.; Toh, Y.T.; Quan, C. 
822012HAMR media design in optical and thermal respectsXu, B.; Cen, Z.; Goh, J.H.; Li, J.; Ye, K.; Zhang, J.; Yang, H.; Toh, Y.T.; Quan, C. 
831-Jul-2003Height measurement of microchip connecting pins by use of stereovisionTay, C.J. ; Kang, X. ; Quan, C. ; He, X.Y.; Shang, H.M. 
41998Holographic contouring using double-source technique and Fourier transform analysisQuan, C. ; Shang, H.M. ; Tay, C.J. ; Bryanston-Cross, P.J.
5May-1997Holographic Determination of the Residual Strength of Arbitrarily Clamped, Centrally Thinned Circular PlatesShang, H.M. ; Quan, C. ; Tay, C.J. ; Tay, T.E. ; Qin, S. 
62002Impact of transmission error for attenuated phase shift mask for 0.10 um TechnologyTan, S.K.; Lin, Q.; Quan, C. ; Tay, C.J. 
7Mar-2004Improvement of Rayleigh criterion with duty ratio characterization for subwavelength lithographyChua, G.S.; Tay, C.J. ; Quan, C. ; Lin, Q.
815-Mar-2003In situ surface roughness measurement using a laser scattering methodTay, C.J. ; Wang, S.H. ; Quan, C. ; Shang, H.M. 
91-Sep-2006Inspection of a micro-cantilever's opened and concealed profile using integrated vertical scanning interferometryQuan, C. ; Tay, C.J. ; Li, M.
101-Sep-2000Inspection of micro-cracks on solderball surface using a laser scattering methodQuan, C. ; Wang, S.H. ; Tay, C.J. ; Shang, H.M. ; Chan, K.C.
11Apr-2004Inspection of micro-solderballs on a semiconductor bumped wafer using optical shadowgraphTay, C.J. ; Wang, S.H. ; Quan, C. 
1220-Jul-2004Instantaneous velocity displacement and contour measurement by use of shadow moiré and temporal wavelet analysisTay, C.J. ; Quan, C. ; Fu, Y. ; Huang, Y.
131-Nov-2007Instantaneous velocity measurement of dynamic deformation by digital holographic interferometryChen, H.; Quan, C. ; Tay, C.J. 
14May-2004Integrated method for 3-D rigid-body displacement measurement using fringe projectionTay, C.J. ; Quan, C. ; Wu, T.; Huang, Y.H.
151-Oct-2003Integrated optical inspection on surface geometry and refractive index distribution of a microlens arrayQuan, C. ; Wang, S.H. ; Tay, C.J. ; Reading, I.; Fang, Z.P.
16Aug-2007Investigation of a dual-layer structure using vertical scanning interferometryTay, C.J. ; Quan, C. ; Li, M.
17Mar-2012Investigation of a MEMS piezoelectric energy harvester system with a frequency-widened-bandwidth mechanism introduced by mechanical stoppersLiu, H.; Lee, C. ; Kobayashi, T.; Tay, C.J. ; Quan, C. 
182013Investigation of bias radiation effect on PV cell measurementHuang, X.; Quan, C. ; Chan, J.; Ng, P.
191-Jan-2002Investigation of membrane deformation by a fringe projection methodWang, S. ; Tay, C.J. ; Quan, C. ; Shang, H.M. 
20Aug-2012Investigation of phase error correction for digital sinusoidal phase-shifting fringe projection profilometryMa, S.; Quan, C. ; Zhu, R.; Tay, C.J.