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Quan, Chenggen

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Full Name
Quan, Chenggen
Variants
Chenggen, Q.
Quan, C.G.
Quan, C.
QUAN, CHENGGEN
 
Main Affiliation
 
Faculty
 

Publications

Results 181-200 of 215 (Search time: 0.007 seconds).

Issue DateTitleAuthor(s)
1811-Oct-2001Study on deformation of a microphone membrane using multiple-wavelength interferometryQuan, C. ; Tay, C.J. ; Wang, S.H. ; Shang, H.M. ; Chan, K.C.
2May-2006Study on the use of white light interferometry for multifiber-end surface profile measurementQuan, C. ; Wang, S.H. ; Tay, C.J. ; Reading, I.
32002Sub-0.10 μm Lithography technology with resolution enhancement techniqueChua, G.S.; Lin, Q.; Tay, C.J. ; Quan, C. 
42005Surface contour measurement by grating projection method based on Talbot effectThakur, M. ; Quan, C. ; Tay, C.J. 
510-Jul-2006Surface contouring by optical edge projection based on a continuous wavelet transformQuan, C. ; Miao, H. ; Fu, Y. 
620-May-2011Surface profile measurement in white-light scanning interferometry using a three-chip color CCDMa, S.; Quan, C. ; Zhu, R.; Tay, C.J. ; Chen, L.
7Sep-2004Surface profile measurement of low-frequency vibrating objects using temporal analysis of fringe patternTay, C.J. ; Quan, C. ; Fu, Y. ; Chen, L.J.; Shang, H.M.
81-May-2005Surface profiling of a transparent object by use of phase-shifting Talbot interferometryThakur, M. ; Tay, C.J. ; Quan, C. 
9Apr-2007Surface profiling using fringe projection technique based on Lau effectThakur, M. ; Quan, C. ; Tay, C.J. 
10Oct-2004Surface roughness investigation of semi-conductor wafersTay, C.J. ; Wang, S.H. ; Quan, C. ; Ng, B.L.; Chan, K.C.
11Jun-2000Surface roughness measurement in the submicrometer range using laser scatteringWang, S.H. ; Quan, C. ; Tay, C.J. ; Shang, H.M. 
122002Surface roughness measurement of semi-conductor wafers using a modified total integrated scattering modelTay, C.J. ; Wang, S.H. ; Quan, C. ; Ng, C.K.
132013Temperature effect on measurements of spectral responsivity of reference solar cellHuang, X.; Quan, C. ; Li, Y.; Ng, P.
142008Temporal Paul wavelet analysis for phase retrieval using shadow moiré techniqueNiu, H.T.; Quan, C. ; Tay, C.J. 
152005Temporal phase analysis techniques using wavelet transformQuan, C. ; Fu, Y. ; Tay, C.J. 
1615-Jun-2007Temporal phase retrieval from a complex field in digital holographic interferometryChenggen, Q. ; Cho, J.T. ; Hao, C.
17Nov-2004Temporal wavelet analysis for deformation and velocity measurement in speckle interferometryFu, Y. ; Tay, C.J. ; Quan, C. ; Chen, L.J.
182005Temporal wavelet analysis for deformation measurement of small components using micro-ESPIFu, Y. ; Tay, C.J. ; Quan, C. ; Chen, L.J.
192006The study of Chromeless Phase Lithography (CPL) for 45nm lithographySoon, Y.T.; Qunying, L.; Cho, J.T. ; Chenggen, Q. 
20Jul-2001The use of carrier fringes and FFT in holographic nondestructive testingQuan, C. ; Tay, C.J. ; Shang, H.M.