1. ScholarBank@NUS

Quan, Chenggen

rp08511

Collaboration Map View Statistics Email Alert RSS Feed

Profile

Full Name
Quan, Chenggen
Variants
Chenggen, Q.
Quan, C.G.
Quan, C.
QUAN, CHENGGEN
 
Main Affiliation
 
Faculty
 

Publications

Results 81-100 of 215 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
812013HAMR media design in optical and thermal aspectsXu, B.; Cen, Z.; Goh, J.H.; Li, J.; Ye, K.; Zhang, J.; Yang, H.; Toh, Y.T.; Quan, C. 
822012HAMR media design in optical and thermal respectsXu, B.; Cen, Z.; Goh, J.H.; Li, J.; Ye, K.; Zhang, J.; Yang, H.; Toh, Y.T.; Quan, C. 
831-Jul-2003Height measurement of microchip connecting pins by use of stereovisionTay, C.J. ; Kang, X. ; Quan, C. ; He, X.Y.; Shang, H.M. 
841998Holographic contouring using double-source technique and Fourier transform analysisQuan, C. ; Shang, H.M. ; Tay, C.J. ; Bryanston-Cross, P.J.
85May-1997Holographic Determination of the Residual Strength of Arbitrarily Clamped, Centrally Thinned Circular PlatesShang, H.M. ; Quan, C. ; Tay, C.J. ; Tay, T.E. ; Qin, S. 
862002Impact of transmission error for attenuated phase shift mask for 0.10 um TechnologyTan, S.K.; Lin, Q.; Quan, C. ; Tay, C.J. 
87Mar-2004Improvement of Rayleigh criterion with duty ratio characterization for subwavelength lithographyChua, G.S.; Tay, C.J. ; Quan, C. ; Lin, Q.
8815-Mar-2003In situ surface roughness measurement using a laser scattering methodTay, C.J. ; Wang, S.H. ; Quan, C. ; Shang, H.M. 
91-Sep-2006Inspection of a micro-cantilever's opened and concealed profile using integrated vertical scanning interferometryQuan, C. ; Tay, C.J. ; Li, M.
101-Sep-2000Inspection of micro-cracks on solderball surface using a laser scattering methodQuan, C. ; Wang, S.H. ; Tay, C.J. ; Shang, H.M. ; Chan, K.C.
11Apr-2004Inspection of micro-solderballs on a semiconductor bumped wafer using optical shadowgraphTay, C.J. ; Wang, S.H. ; Quan, C. 
1220-Jul-2004Instantaneous velocity displacement and contour measurement by use of shadow moiré and temporal wavelet analysisTay, C.J. ; Quan, C. ; Fu, Y. ; Huang, Y.
131-Nov-2007Instantaneous velocity measurement of dynamic deformation by digital holographic interferometryChen, H.; Quan, C. ; Tay, C.J. 
14May-2004Integrated method for 3-D rigid-body displacement measurement using fringe projectionTay, C.J. ; Quan, C. ; Wu, T.; Huang, Y.H.
151-Oct-2003Integrated optical inspection on surface geometry and refractive index distribution of a microlens arrayQuan, C. ; Wang, S.H. ; Tay, C.J. ; Reading, I.; Fang, Z.P.
16Aug-2007Investigation of a dual-layer structure using vertical scanning interferometryTay, C.J. ; Quan, C. ; Li, M.
17Mar-2012Investigation of a MEMS piezoelectric energy harvester system with a frequency-widened-bandwidth mechanism introduced by mechanical stoppersLiu, H.; Lee, C. ; Kobayashi, T.; Tay, C.J. ; Quan, C. 
182013Investigation of bias radiation effect on PV cell measurementHuang, X.; Quan, C. ; Chan, J.; Ng, P.
191-Jan-2002Investigation of membrane deformation by a fringe projection methodWang, S. ; Tay, C.J. ; Quan, C. ; Shang, H.M. 
20Aug-2012Investigation of phase error correction for digital sinusoidal phase-shifting fringe projection profilometryMa, S.; Quan, C. ; Zhu, R.; Tay, C.J.