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Xie Min

rp08117

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Full Name
Xie Min
(not current staff)
Variants
Min, X.
Xie, M.
 
Main Affiliation
 
Faculty
 
Email
isexiem@nus.edu.sg
 

Publications

Refined By:
Date Issued:  [1950 TO 1999]

Results 41-60 of 63 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
411995Reliability by design a tool to reduce time-to-marketFoo, S.W. ; Lien, W.L.; Xie, M. ; van Geest, E.
421995Reliability by design a tool to reduce time-to-marketFoo, S.W. ; Lien, W.L.; Xie, M. ; van Geest, E.
43Jun-1996Reliability growth plot - An underutilized tool in reliability analysisXie, M. ; Zhao, M.
44Jun-1996Reliability growth plot - An underutilized tool in reliability analysisXie, M. ; Zhao, M.
451999Sensitivity of the relationship matrix in quality function deploymentShen, X.X.; Tan, K.C. ; Xie, M. ; Goh, T.N. ; Wang, H. 
46May-1995Shewhart-like charting technique for high yield processesXie, W.; Xie, M. ; Goh, T.N. 
47May-1995Shewhart-like charting technique for high yield processesXie, W.; Xie, M. ; Goh, T.N. 
48Oct-1999Software release time determination based on unbounded NHPP modelXie, M. ; Hong, G.Y.
49Oct-1999Software release time determination based on unbounded NHPP modelXie, M. ; Hong, G.Y.
50Mar-1993Software reliability models-a selected annotated bibliographyXie, M. 
51Mar-1993Software reliability models-a selected annotated bibliographyXie, M. 
5215-Dec-1999Software reliability prediction incorporating information from a similar projectXie, M. ; Hong, G.Y.; Wohlin, C.
5315-Dec-1999Software reliability prediction incorporating information from a similar projectXie, M. ; Hong, G.Y.; Wohlin, C.
54Jul-1992Some procedures for decision making in controlling high yield processesXie, M. ; Goh, T.N. 
55Jul-1992Some procedures for decision making in controlling high yield processesXie, M. ; Goh, T.N. 
56Mar-1993SPC of a near zero-defect process subject to random shocksXie, M. ; Goh, T.N. 
57Mar-1993SPC of a near zero-defect process subject to random shocksXie, M. ; Goh, T.N. 
58Oct-1999Statistical method for controlling software defect detection processHong, G.Y.; Xie, M. ; Shanmugan, P.
591999Statistical techniques for qualityXie, M. ; Goh, T.N. 
60Oct-1998The use of ARIMA models for reliability forecasting and analysisHo, S.L.; Xie, M.