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Title: Reliability by design a tool to reduce time-to-market
Authors: Foo, S.W. 
Lien, W.L.
Xie, M. 
van Geest, E.
Issue Date: 1995
Citation: Foo, S.W.,Lien, W.L.,Xie, M.,van Geest, E. (1995). Reliability by design a tool to reduce time-to-market. IEEE International Engineering Management Conference : 251-256. ScholarBank@NUS Repository.
Abstract: Reliability of products plays a crucial role in retaining brand loyalty. The conventional approach to reliability analysis resorts to testing the prototype and entails long development time. This is undesirable for electronic products which have very short life cycle. Reliability by design using the stressor-susceptibility interaction model provides a way to address this dilemma. Management no longer have to forgo reliability analysis in the race to shorten time-to-market.
Source Title: IEEE International Engineering Management Conference
Appears in Collections:Staff Publications

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