Shewhart-like charting technique for high yield processes

Abstract

A Shewhart-like charting technique is developed in this paper to overcome the difficulties the traditional control chart encounters in the control of processes with a very low fraction non-conforming. The technique uses the number of conforming items between two consecutive non-conforming ones to monitor the fraction non-conforming of a process, leading to a chart that is informative and easy to interpreter. The approach discussed is especially suitable for real-time and automatic statistical quality control.