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|Title:||Shewhart-like charting technique for high yield processes|
|Citation:||Xie, W.,Xie, M.,Goh, T.N. (1995-05). Shewhart-like charting technique for high yield processes. Quality and Reliability Engineering International 11 (3) : 189-196. ScholarBank@NUS Repository.|
|Abstract:||A Shewhart-like charting technique is developed in this paper to overcome the difficulties the traditional control chart encounters in the control of processes with a very low fraction non-conforming. The technique uses the number of conforming items between two consecutive non-conforming ones to monitor the fraction non-conforming of a process, leading to a chart that is informative and easy to interpreter. The approach discussed is especially suitable for real-time and automatic statistical quality control.|
|Source Title:||Quality and Reliability Engineering International|
|Appears in Collections:||Staff Publications|
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