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Shen Zexiang

rp05738

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Full Name
Shen Zexiang
(not current staff)
Variants
Shen, Z.X.
SHEN, ZE XIANG
Zexiang, S.
Shen, Z.-X.
Shen, Z.
 
Main Affiliation
 
Faculty
 
Email
physzx@nus.edu.sg
 

Publications

Results 141-158 of 158 (Search time: 0.011 seconds).

Issue DateTitleAuthor(s)
14129-Apr-2003Surface-enhanced Raman of Z-vibration mode in single-walled and multi-walled carbon nanotubeZhang, X.; Zhang, W.; Liu, L. ; Shen, Z.X. 
225-Dec-2000Synthesis and characterization of pure C40 TiSi2Chen, S.Y.; Shen, Z.X. ; Li, K.; See, A.K.; Chan, L.H.
31999Synthesis and raman spectra of cupric oxide quantum dotsXu, J.F. ; Ji, W. ; Shen, Z.X. ; Tang, S.H. ; Ye, X.R.; Jia, D.Z.; Xin, X.Q.
42002Synthesis of pure C40 TiSi2 for Si wafer fabricationChen, S.Y.; Shen, Z.X. ; Xu, S.Y. ; See, A.K. ; Chan, L.H.; Li, W.S. 
5Apr-2000Temperature dependence of Raman scattering in hexagonal gallium nitride filmsLi, W.S. ; Shen, Z.X. ; Feng, Z.C.; Chua, S.J.
6Jul-1998Temperature Dependence of the Raman Scattering Spectra of Zn/ZnO NanoparticlesXu, J. ; Ji, W. ; Wang, X.B.; Shu, H.; Shen, Z.X. ; Tang, S.H. 
7Oct-1992The assignment of natural abundant IR and Raman isotope bands and crystal field effects in AgNO3Shen, Z.X. ; Kuok, M.H. ; Tang, S.H. ; Sherman, W.F.
82005The effect of film thickness on the C40 TiSi2 to C54 TiSi 2 transition temperatureTan, S.C. ; Liu, L. ; Zeng, Y.P.; See, A.; Shen, Z.X. 
92000The effects of mechanical activation in synthesizing ultrafine barium ferrite powders from co-precipitated precursorsLiu, X.; Wang, J. ; Ding, J. ; Chen, M.S.; Shen, Z.X. 
10Mar-1993The structure of TlNO3 by transmission and reflection IR spectra at low temperatureShen, Z.X. ; Sherman, W.F.
11Feb-2000Thermal cure study of a low-k methyl silsesquioxane for intermetal dielectric application by FT-IR spectroscopyWang, C.Y.; Shen, Z.X. ; Zheng, J.Z.
12Sep-2004Thermal stability of strained Si/Si1-xGex heterostructures for advanced microelectronics devicesWong, L.H.; Wong, C.C.; Ong, K.K.; Liu, J.P.; Chan, L.; Rao, R.; Pey, K.L.; Liu, L. ; Shen, Z.X. 
13Jan-2004Thermal stability study of NiSi and NiSi2 thin filmsZhao, F.F.; Zheng, J.Z. ; Shen, Z.X. ; Osipowicz, T. ; Gao, W.Z.; Chan, L.H.
142002Thickness effect on nickel silicide formation and thermal stability for ultra shallow junction CMOSZhao, F.F.; Shen, Z.X. ; Zheng, J.Z.; Gao, W.Z.; Osipowicz, T. ; Pang, C.H.; Lee, P.S.; See, A.K.
1515-Jun-2003Two-dimensional structures of ferroelectric domain inversion in LiNbO3 by direct electron beam lithographyHe, J. ; Tang, S.H. ; Qin, Y.Q. ; Dong, P.; Zhang, H.Z. ; Kang, C.H.; Sun, W.X. ; Shen, Z.X. 
161999Ultrafine barium titanate powders via microemulsion processing routesWang, J. ; Fang, J.; Ng, S.-C. ; Gan, L.-M. ; Chew, C.-H. ; Wang, X.; Shen, Z. 
17May-2003Unique dielectric behavior of 0.6Pb(Ni1/2W1/2)O3·0.4PbTiO3 derived from mechanical activationGao, X. ; Xue, J. ; Wang, J. ; Yu, T. ; Shen, Z.X. 
18Jun-1998Vibrational spectroscopic analysis of ferroelectric liquid crystal MBOPDOBHe, L.; Yin, Z.; Zhang, M.-S.; Shen, Z.-X. ; Chen, H.-F.