Full Name
Zeng Ji Nan
Zeng, J.N.


Results 1-8 of 8 (Search time: 0.012 seconds).

Issue DateTitleAuthor(s)
12002Advanced laser applications in microelectronics and data storage devices (invited)Lu, Y.F.; Song, W.D. ; Ren, Z.M.; An, C.W.; Liu, D.M.; Wang, W.J. ; Cho, B.J. ; Zeng, J.N. ; Tan, C.F.
22002Characterization of modified surface of indium tin oxide film during process of laser patterningZeng, J.N. ; Koh, H.L.; Ren, Z.M.; Song, W.D. ; Lu, Y.F. 
32002Effect of deposition conditions on optical and electrical properties of ZnO films prepared by pulsed laser depositionZeng, J.N. ; Low, J.K.; Ren, Z.M.; Liew, T. ; Lu, Y.F. 
4Feb-2004Laser annealing of silicon nanocrystal films formed by pulsed-laser depositionTan, C.F.; Chen, X.Y.; Lu, Y.F.; Wu, Y.H. ; Cho, B.J. ; Zeng, J.N. 
52002Laser microprocessing in microelectronics, data storage and photonicsLu, Y.F. ; Song, W.D. ; Ren, Z.M.; An, C.W.; Liu, D.M.; Huang, S.M.; Wang, W.J. ; Hong, M.H. ; Chong, T.C. ; Cho, B.J. ; Zeng, J.N. ; Tan, C.F.
612-Aug-2002Pattern-induced ripple structures at silicon-oxide/silicon interface by excimer laser irradiationChen, X.Y.; Lu, Y.F. ; Cho, B.J. ; Zeng, Y.P.; Zeng, J.N. ; Wu, Y.H. 
7May-2004Raman spectroscopy investigation on excimer laser annealing and thickness determination of nanoscale amorphous siliconZeng, Y.P.; Lu, Y.F.; Shen, Z.X. ; Sun, W.X. ; Yu, T. ; Liu, L. ; Zeng, J.N. ; Cho, B.J. ; Poon, C.H.
82002Temperature effect for exciton dynamics in ZnCdSe/ZnSe QWsZeng, J.N. ; Lu, Y.F. ; Oka, Y.