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Gong Hao

rp01924

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Full Name
Gong Hao
Variants
Hao, G.
Gong, Hao
Gong, H.
HAO, GONG
GONG, HAO
Gong H.
 
Main Affiliation
 
Faculty
 
Email
msegongh@nus.edu.sg
 

Publications

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Department:  MATERIALS SCIENCE
Type:  Article

Results 1-20 of 73 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
11996A multi-technique study of the surface preparation of InSb substrate and subsequently grown CdTe films by molecular beam epitaxyFeng, Z.C. ; Gong, H. ; Choyke, W.J.; Doyle, N.J.; Farrow, R.F.C.
22005A study of conduction in the transition zone between homologous and ZnO-rich regions in the In 2 O 3 -ZnO systemKumar, B. ; Gong, H. ; Akkipeddi, R.
31-May-1996A time-resolved current method for the investigation of charging ability of insulators under electron beam irradiationSong, Z.G.; Ong, C.K. ; Gong, H. 
4Sep-2000Analysis of triple Co alloy layer magnetic thin films with different bias configurationJin, D.; Wang, J.P.; Gong, H. 
53-Mar-1998Anisothermal oxidation of micro-crystalline Ni-20Cr-5Al alloy coating at 850-1280°CLiu, Z.; Gao, W.; Gong, H. 
6Jul-2001Annealing effects of tantalum films on Si and SiO2/Si substrates in various vacuumsLiu, L. ; Wang, Y. ; Gong, H. 
720-Oct-2001Annealing effects of tantalum thin films sputtered on [001] silicon substrateLiu, L. ; Gong, H. ; Wang, Y. ; Wang, J. ; Wee, A.T.S ; Liu, R. 
8Jan-1996Backscattering factor for KLL Auger yield from film-substrate systemsLee, C.L. ; Kong, K.Y.; Gong, H. ; Ong, C.K. 
9Oct-2001Characterisation of high temperature corrosion products on FeAl intermetallics by XPSXu, C.-H.; Gao, W.; Hyland, M.; Gong, H. 
10Dec-1995Charging of deformed semicrystalline polymers observed with a scanning electron microscopeGong, H. ; Chooi, K.M.; Ong, C.K. 
11May-2001Correspondence: Effects of deliberate copper contamination from the plating solution on the electrical characteristics of MOSFETsTee, K.C.; Prasad, K.; Lee, C.S.; Gong, H. ; Cha, C.L.; Chan, L.; See, A.K.
121995Determination of charge distribution volume in electron irradiated insulators by scanning electron microscopeChen, H.; Gong, H. ; Ong, C.K. 
1317-Feb-1997Discharging behaviour on insulator surfaces in vacuum: A scanning electron microscopy observationGong, H. ; Ong, C.K. 
1422-Feb-2005Dopant sources choice for formation of p-type ZnO: Phosphorus compound sourcesYu, Z.G.; Gong, H. ; Wu, P.
15Feb-2005Dynamic thermal degradation studies on amorphous carbon thin filmsLi, Y.Q.; Zhang, L.H.; Gong, H. 
1627-Oct-1997Dynamics aspects of the charging behaviour of polymers under focused electron beam irradiationOng, C.K. ; Song, Z.G.; Gong, H. 
17May-2000Effect of magnetic anisotropy distribution in longitudinal thin film mediaHee, C.H.; Wang, J.P.; Gong, H. ; Low, T.S. 
1820-Oct-2001Effects of nominal intermediate layer on microstructure and magnetic property in CoCrPtTa/CrTi thin filmsJin, D.; Wang, J.P.; Gong, H. 
192000Effects of surface smoothness and deposition temperature of floating gates in flash memory devices to oxide/nitride/oxide interpoly dielectric breakdownCha, C.L.; Chor, E.F. ; Gong, H. ; Chan, L.
201-Aug-2001Electrical characterization and metallurgical analysis of Pd-containing multilayer contacts on GaNChor, E.F. ; Zhang, D.; Gong, H. ; Chen, G.L.; Liew, T.Y.F.