Please use this identifier to cite or link to this item:
|Title:||Determination of charge distribution volume in electron irradiated insulators by scanning electron microscope|
|Source:||Chen, H., Gong, H., Ong, C.K. (1995). Determination of charge distribution volume in electron irradiated insulators by scanning electron microscope. Journal of Applied Physics 78 (6) : 3714-3718. ScholarBank@NUS Repository. https://doi.org/10.1063/1.359950|
|Abstract:||The scanning electron microscope mirror image method is developed to measure the charge distribution volume in insulators. An electrostatic potential expression is derived by assuming the dipolar approximation and hemispheroid distribution. Dielectric samples with different relative permittivities are employed in charging experiments to justify our approach. The proposed method is employed to measure the radius of the charge distribution volume in polymethylmethacrylate samples irradiated by electron beams with energy ranging from 25 to 39 keV. Experimental results achieved are in good agreement with those obtained through the use of other experimental techniques and Monte Carlo simulation. The strength of the present method is in its ability to quantitatively give the total trapped charge and its distribution in the electron irradiated insulators in a single experiment. © 1995 American Institute of Physics.|
|Source Title:||Journal of Applied Physics|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Feb 14, 2018
WEB OF SCIENCETM
checked on Jan 22, 2018
checked on Feb 19, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.