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Gong Hao

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Full Name
Gong Hao
Variants
Hao, G.
Gong, Hao
Gong, H.
HAO, GONG
GONG, HAO
Gong H.
 
Main Affiliation
 
Faculty
 
Email
msegongh@nus.edu.sg
 

Publications

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Department:  MATERIALS SCIENCE
Author:  Gong, H.
Date Issued:  2001

Results 1-14 of 14 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
1Jul-2001Annealing effects of tantalum films on Si and SiO2/Si substrates in various vacuumsLiu, L. ; Wang, Y. ; Gong, H. 
220-Oct-2001Annealing effects of tantalum thin films sputtered on [001] silicon substrateLiu, L. ; Gong, H. ; Wang, Y. ; Wang, J. ; Wee, A.T.S ; Liu, R. 
3Oct-2001Characterisation of high temperature corrosion products on FeAl intermetallics by XPSXu, C.-H.; Gao, W.; Hyland, M.; Gong, H. 
4May-2001Correspondence: Effects of deliberate copper contamination from the plating solution on the electrical characteristics of MOSFETsTee, K.C.; Prasad, K.; Lee, C.S.; Gong, H. ; Cha, C.L.; Chan, L.; See, A.K.
520-Oct-2001Effects of nominal intermediate layer on microstructure and magnetic property in CoCrPtTa/CrTi thin filmsJin, D.; Wang, J.P.; Gong, H. 
61-Aug-2001Electrical characterization and metallurgical analysis of Pd-containing multilayer contacts on GaNChor, E.F. ; Zhang, D.; Gong, H. ; Chen, G.L.; Liew, T.Y.F.
726-Jun-2001Embedded polysilicon gate MOSFETCHAN, LAP; CHA, CHER LIANG; CHOR, ENG FONG ; HAO, GONG ; LEE, TECK KOON
82-Apr-2001Laser and thermal induced micro-structural changes and decomposition of hydrogenated carbon filmsZhang, L.H.; Wang, J.P.; Gong, H. 
920-Oct-2001Mo and W doping effects on CoCrPt thin filmsJin, D.; Wang, J.P.; Han, Q.; Gong, H. 
1022-Aug-2001Optical and electrical properties of p-type transparent conducting Cu-Al-O thin films prepared by plasma enhanced chemical vapor depositionWang, Y. ; Gong, H. ; Zhu, F.; Liu, L. ; Huang, L. ; Huan, A.C.H.
11Oct-2001Oxidation behaviour of Cu thin films on Si wafer at 175-400°CGao, W.; Gong, H. ; He, J.; Thomas, A.; Chan, L.; Li, S.
122001SiO2 modified Co-ferrite with high coercivityDing, J. ; Gong, H. ; Melaka, R.; Wang, S. ; Shi, Y. ; Chen, Y.J. ; Phuc, N.X.
13Oct-2001Study of copper suicide retardation effects on copper diffusion in siliconLee, C.S.; Gong, H. ; Liu, R. ; Wee, A.T.S. ; Cha, C.L.; See, A.; Chan, L.
141-Oct-2001Surface photovoltaic properties of sputtered Mo/Si multilayersLi, W. ; Gong, H. ; Cao, Y.; Du, H.