Please use this identifier to cite or link to this item: https://doi.org/10.1209/0295-5075/89/46005
Title: Topology-induced thermal rectification in carbon nanodevice
Authors: Jiang, J.W. 
Wang, J.S. 
Li, B. 
Issue Date: 2010
Citation: Jiang, J.W., Wang, J.S., Li, B. (2010). Topology-induced thermal rectification in carbon nanodevice. EPL 89 (4) : -. ScholarBank@NUS Repository. https://doi.org/10.1209/0295-5075/89/46005
Abstract: The thermal rectification (TR) effect in a topological system, Möbius graphene strip, is studied by nonequilibrium molecular-dynamics simulation with Nóse-Hoover heat baths. Due to the nonlinear interaction in graphene and the topological asymmetry of the Möbius strip, the TR phenomenon emerges and the value of TR can be as large as 120%. This topology-induced TR is not very sensitive to the temperature and size of the system; while the position of heat bath is important, since it can induce additional asymmetry. © 2010 EPLA.
Source Title: EPL
URI: http://scholarbank.nus.edu.sg/handle/10635/98425
ISSN: 02955075
DOI: 10.1209/0295-5075/89/46005
Appears in Collections:Staff Publications

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