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https://doi.org/10.1063/1.3466914
Title: | Role of oxygen incorporation in electronic properties of rubrene films | Authors: | Song, X. Wang, L. Fan, Q. Wu, Y. Wang, H. Liu, C. Liu, N. Zhu, J. Qi, D. Gao, X. Wee, A.T.S. |
Issue Date: | 19-Jul-2010 | Citation: | Song, X., Wang, L., Fan, Q., Wu, Y., Wang, H., Liu, C., Liu, N., Zhu, J., Qi, D., Gao, X., Wee, A.T.S. (2010-07-19). Role of oxygen incorporation in electronic properties of rubrene films. Applied Physics Letters 97 (3) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3466914 | Abstract: | The electronic properties of rubrene films exposed to oxygen have been studied by photoemission and x-ray absorption spectroscopies. Oxygen incorporation causes the highest occupied molecular orbital of rubrene to shift to a ∼1.0 eV deep level due to chemical bonds formed by the oxygen atoms with the carbon atoms within the tetracene backbone of rubrene molecules. Deformation of the molecular backbone induced by the C-O bonds destroys the delocalized nature of the molecular orbitals. The oxidized rubrene molecules in a single crystal are proposed to act as point defects that disturb the long-range periodicity and produce localized acceptor states. © 2010 American Institute of Physics. | Source Title: | Applied Physics Letters | URI: | http://scholarbank.nus.edu.sg/handle/10635/97836 | ISSN: | 00036951 | DOI: | 10.1063/1.3466914 |
Appears in Collections: | Staff Publications |
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