Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.3466914
Title: Role of oxygen incorporation in electronic properties of rubrene films
Authors: Song, X.
Wang, L.
Fan, Q.
Wu, Y.
Wang, H.
Liu, C.
Liu, N.
Zhu, J.
Qi, D. 
Gao, X. 
Wee, A.T.S. 
Issue Date: 19-Jul-2010
Citation: Song, X., Wang, L., Fan, Q., Wu, Y., Wang, H., Liu, C., Liu, N., Zhu, J., Qi, D., Gao, X., Wee, A.T.S. (2010-07-19). Role of oxygen incorporation in electronic properties of rubrene films. Applied Physics Letters 97 (3) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3466914
Abstract: The electronic properties of rubrene films exposed to oxygen have been studied by photoemission and x-ray absorption spectroscopies. Oxygen incorporation causes the highest occupied molecular orbital of rubrene to shift to a ∼1.0 eV deep level due to chemical bonds formed by the oxygen atoms with the carbon atoms within the tetracene backbone of rubrene molecules. Deformation of the molecular backbone induced by the C-O bonds destroys the delocalized nature of the molecular orbitals. The oxidized rubrene molecules in a single crystal are proposed to act as point defects that disturb the long-range periodicity and produce localized acceptor states. © 2010 American Institute of Physics.
Source Title: Applied Physics Letters
URI: http://scholarbank.nus.edu.sg/handle/10635/97836
ISSN: 00036951
DOI: 10.1063/1.3466914
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