Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/96441
Title: ELIMINATION OF AMBIGUITY IN MEASUREMENT OF PERMITTIVITY WITH SHORT-CIRCUITED WAVEGUIDE.
Authors: Oh, K.H. 
Ong, C.K. 
Tan, B.T.G. 
Issue Date: 1-Jan-1987
Citation: Oh, K.H.,Ong, C.K.,Tan, B.T.G. (1987-01-01). ELIMINATION OF AMBIGUITY IN MEASUREMENT OF PERMITTIVITY WITH SHORT-CIRCUITED WAVEGUIDE.. Electronics Letters 23 (22) : 1181-1183. ScholarBank@NUS Repository.
Abstract: A new experimental parameter is introduced to eliminate the ambiguity in the short-circuited waveguide method for measuring permittivity. The results of our measurements using this technique for some standard materials are also presented.
Source Title: Electronics Letters
URI: http://scholarbank.nus.edu.sg/handle/10635/96441
ISSN: 00135194
Appears in Collections:Staff Publications

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