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|Title:||ELIMINATION OF AMBIGUITY IN MEASUREMENT OF PERMITTIVITY WITH SHORT-CIRCUITED WAVEGUIDE.||Authors:||Oh, K.H.
|Issue Date:||1-Jan-1987||Citation:||Oh, K.H.,Ong, C.K.,Tan, B.T.G. (1987-01-01). ELIMINATION OF AMBIGUITY IN MEASUREMENT OF PERMITTIVITY WITH SHORT-CIRCUITED WAVEGUIDE.. Electronics Letters 23 (22) : 1181-1183. ScholarBank@NUS Repository.||Abstract:||A new experimental parameter is introduced to eliminate the ambiguity in the short-circuited waveguide method for measuring permittivity. The results of our measurements using this technique for some standard materials are also presented.||Source Title:||Electronics Letters||URI:||http://scholarbank.nus.edu.sg/handle/10635/96441||ISSN:||00135194|
|Appears in Collections:||Staff Publications|
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