Analysis of stoichiometry of high-Tc superconducting films by RBS and PIXE methods

Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/95776

Title:	Analysis of stoichiometry of high-Tc superconducting films by RBS and PIXE methods
Authors:	Šandrik, R. Jergel, M. Štrbik, V. Nakamura, K. Ishii, A. Orlic, I. Tang, S.M. Watt, F.
Issue Date:	Sep-1996
Citation:	Šandrik, R.,Jergel, M.,Štrbik, V.,Nakamura, K.,Ishii, A.,Orlic, I.,Tang, S.M.,Watt, F. (1996-09). Analysis of stoichiometry of high-Tc superconducting films by RBS and PIXE methods. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 118 (1-4) : 602-607. ScholarBank@NUS Repository.
Abstract:	Lateral inhomogeneity has been studied in thin films of YBa2Cu3O7-δ deposited from aerosol on MgO substrates. RBS and PIXE analyses distinguished areas that were found to differ in the critical temperature TQ values. The PIXE results confirmed the differences in composition between those areas. Variations in layer thicknesses were found by means of RBS analysis. Measurements made with a microbeam showed that the film within each of those areas was homogeneous. However, significant variations in the Y-Ba-Cu-O stoichiometry and local changes in the film thickness were found in the intermediate zone between areas with 7C = 85 K and T1,
Source Title:	Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
URI:	http://scholarbank.nus.edu.sg/handle/10635/95776
ISSN:	0168583X
Appears in Collections:	Staff Publications

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