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|Title:||Ferroelectric properties of heterolayered lead zirconate titanate thin films||Authors:||Kartawidjaja, F.C.
Heterolayered PZT thin films
|Issue Date:||Jul-2006||Citation:||Kartawidjaja, F.C., Zhou, Z., Wang, J. (2006-07). Ferroelectric properties of heterolayered lead zirconate titanate thin films. Journal of Electroceramics 16 (4) : 425-430. ScholarBank@NUS Repository. https://doi.org/10.1007/s10832-006-9892-2||Abstract:||Heterolayered Pb(Zr1 - x Ti x )O3 thin films consisting of alternating PbZr0.7Ti0.3O3 and PbZr0.3Ti0.7O3 layers were successfully deposited via a multistep sol-gel route assisted by spin-coating. These heterolayered PZT films, when annealed at a temperature in the range of 600-700°C show (001)/(100) preferred orientation, demonstrate desired ferroelectric and dielectric properties. The most interesting ferroelectric and dielectric properties were obtained from the six-layered PZT thin film annealed at 650°C, which exhibits a remanent polarization of 47.7 μC/cm 2 and a dielectric permittivity of 1002 at 100 Hz. Reversible polarization constituents a considerably high contribution towards the ferroelectric hysteresis of the heterolayered PZT films, as shown by studies obtained from C-V and AC measurement. © Springer Science + Business Media, LLC 2006.||Source Title:||Journal of Electroceramics||URI:||http://scholarbank.nus.edu.sg/handle/10635/86885||ISSN:||13853449||DOI:||10.1007/s10832-006-9892-2|
|Appears in Collections:||Staff Publications|
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