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https://doi.org/10.1016/j.apsusc.2011.09.083
| Title: | BiFeO3/Zn1-xMnxO bilayered thin films | Authors: | Wu, J. Wang, J. Xiao, D. Zhu, J. |
Keywords: | BiFeO3/Zn1-xMnxO Bilayered thin films Electrical properties Magnetron sputtering |
Issue Date: | 1-Dec-2011 | Citation: | Wu, J., Wang, J., Xiao, D., Zhu, J. (2011-12-01). BiFeO3/Zn1-xMnxO bilayered thin films. Applied Surface Science 258 (4) : 1390-1394. ScholarBank@NUS Repository. https://doi.org/10.1016/j.apsusc.2011.09.083 | Abstract: | BiFeO3/Zn1-xMnxO (x = 0-0.08) bilayered thin films were deposited on the SrRuO3/Pt/TiO2/SiO 2/Si(1 0 0) substrates by radio frequency sputtering. A highly (1 1 0) orientation was induced for BiFeO3/Zn1-xMn xO. BiFeO3/Zn1-xMnxO thin films demonstrate diode-like and resistive hysteresis behavior. A remanent polarization in the range of 2Pr ∼ 121.0-130.6 μC/cm 2 was measured for BiFeO3/Zn1-xMnxO. BiFeO3/Zn1-xMnxO (x = 0.04) bilayer exhibits a highest Ms value of ∼15.2 emu/cm3, owing to the presence of the magnetic Zn0.96Mn0.04O layer with an enhanced Ms value. © 2011 Elsevier B.V. All rights reserved. | Source Title: | Applied Surface Science | URI: | http://scholarbank.nus.edu.sg/handle/10635/86197 | ISSN: | 01694332 | DOI: | 10.1016/j.apsusc.2011.09.083 |
| Appears in Collections: | Staff Publications |
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