Please use this identifier to cite or link to this item:
|Title:||BiFeO3/Zn1-xMnxO bilayered thin films|
Bilayered thin films
|Citation:||Wu, J., Wang, J., Xiao, D., Zhu, J. (2011-12-01). BiFeO3/Zn1-xMnxO bilayered thin films. Applied Surface Science 258 (4) : 1390-1394. ScholarBank@NUS Repository. https://doi.org/10.1016/j.apsusc.2011.09.083|
|Abstract:||BiFeO3/Zn1-xMnxO (x = 0-0.08) bilayered thin films were deposited on the SrRuO3/Pt/TiO2/SiO 2/Si(1 0 0) substrates by radio frequency sputtering. A highly (1 1 0) orientation was induced for BiFeO3/Zn1-xMn xO. BiFeO3/Zn1-xMnxO thin films demonstrate diode-like and resistive hysteresis behavior. A remanent polarization in the range of 2Pr ∼ 121.0-130.6 μC/cm 2 was measured for BiFeO3/Zn1-xMnxO. BiFeO3/Zn1-xMnxO (x = 0.04) bilayer exhibits a highest Ms value of ∼15.2 emu/cm3, owing to the presence of the magnetic Zn0.96Mn0.04O layer with an enhanced Ms value. © 2011 Elsevier B.V. All rights reserved.|
|Source Title:||Applied Surface Science|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on May 21, 2018
WEB OF SCIENCETM
checked on Apr 24, 2018
checked on May 18, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.