Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.apsusc.2011.09.083
Title: BiFeO3/Zn1-xMnxO bilayered thin films
Authors: Wu, J.
Wang, J. 
Xiao, D.
Zhu, J.
Keywords: BiFeO3/Zn1-xMnxO
Bilayered thin films
Electrical properties
Magnetron sputtering
Issue Date: 1-Dec-2011
Citation: Wu, J., Wang, J., Xiao, D., Zhu, J. (2011-12-01). BiFeO3/Zn1-xMnxO bilayered thin films. Applied Surface Science 258 (4) : 1390-1394. ScholarBank@NUS Repository. https://doi.org/10.1016/j.apsusc.2011.09.083
Abstract: BiFeO3/Zn1-xMnxO (x = 0-0.08) bilayered thin films were deposited on the SrRuO3/Pt/TiO2/SiO 2/Si(1 0 0) substrates by radio frequency sputtering. A highly (1 1 0) orientation was induced for BiFeO3/Zn1-xMn xO. BiFeO3/Zn1-xMnxO thin films demonstrate diode-like and resistive hysteresis behavior. A remanent polarization in the range of 2Pr ∼ 121.0-130.6 μC/cm 2 was measured for BiFeO3/Zn1-xMnxO. BiFeO3/Zn1-xMnxO (x = 0.04) bilayer exhibits a highest Ms value of ∼15.2 emu/cm3, owing to the presence of the magnetic Zn0.96Mn0.04O layer with an enhanced Ms value. © 2011 Elsevier B.V. All rights reserved.
Source Title: Applied Surface Science
URI: http://scholarbank.nus.edu.sg/handle/10635/86197
ISSN: 01694332
DOI: 10.1016/j.apsusc.2011.09.083
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