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https://scholarbank.nus.edu.sg/handle/10635/85928
| Title: | Drop impact: Fundamentals & impact characterisation of solder joints | Authors: | Wong, E.H. Rajoo, R. Mai, Y.W. Seah, S.K.W. Tsai, K.T. Yap, L.M. |
Issue Date: | 2005 | Citation: | Wong, E.H.,Rajoo, R.,Mai, Y.W.,Seah, S.K.W.,Tsai, K.T.,Yap, L.M. (2005). Drop impact: Fundamentals & impact characterisation of solder joints. Proceedings - Electronic Components and Technology Conference 2 : 1202-1209. ScholarBank@NUS Repository. | Abstract: | This paper presents a summary of the fundamental theories behind board level drop impact covering the dynamics of drop impact assembly, dynamics of PCB, as well as interconnection stress. This is followed by a comprehensive study of the fracture characteristics of solder interconnections under high-speed impact using a newly developed Micro Impactor which provides both the fracture strength as well as fracture energy of impact. The test matrix consists of 5 solder alloys, 4 pad finishing, 3 thermal histories, and 2 solder mask designs forming a total of 120 combinations. The test has highlighted weakness in NSMD design and caution on SnAgCu solder when used in drop impact application. © 2005 IEEE. | Source Title: | Proceedings - Electronic Components and Technology Conference | URI: | http://scholarbank.nus.edu.sg/handle/10635/85928 | ISSN: | 05695503 |
| Appears in Collections: | Staff Publications |
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