Please use this identifier to cite or link to this item:
https://doi.org/10.1109/RFIT.2012.6401630
DC Field | Value | |
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dc.title | High temperature bandgap reference in PDSOI CMOS with operating temperature up to 300°C | |
dc.contributor.author | Pathrose, J. | |
dc.contributor.author | Gong, X. | |
dc.contributor.author | Zou, L. | |
dc.contributor.author | Koh, J. | |
dc.contributor.author | Chai, K.T.C. | |
dc.contributor.author | Je, M. | |
dc.contributor.author | Xu, Y.P. | |
dc.date.accessioned | 2014-10-07T04:45:16Z | |
dc.date.available | 2014-10-07T04:45:16Z | |
dc.date.issued | 2012 | |
dc.identifier.citation | Pathrose, J.,Gong, X.,Zou, L.,Koh, J.,Chai, K.T.C.,Je, M.,Xu, Y.P. (2012). High temperature bandgap reference in PDSOI CMOS with operating temperature up to 300°C. Proceedings of the 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012 : 110-112. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/RFIT.2012.6401630" target="_blank">https://doi.org/10.1109/RFIT.2012.6401630</a> | |
dc.identifier.isbn | 9781467323048 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/83794 | |
dc.description.abstract | This paper describes a bandgap reference with temperature range up to 300°C. Fabricated in a PDSOI CMOS technology, the bandgap reference achieves a box model temperature coefficient of 138ppm from 25 to 300°C, and line regulation less than 1.5mv/V. The minimum operating voltage is 2V and consumes merely 285μW at room temperature over several samples. © 2012 IEEE. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/RFIT.2012.6401630 | |
dc.source | Scopus | |
dc.subject | Bandgap Reference | |
dc.subject | High Temperature | |
dc.subject | Op-amp Offset | |
dc.subject | SOI | |
dc.subject | Temperature Compensation | |
dc.type | Conference Paper | |
dc.contributor.department | ELECTRICAL & COMPUTER ENGINEERING | |
dc.description.doi | 10.1109/RFIT.2012.6401630 | |
dc.description.sourcetitle | Proceedings of the 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012 | |
dc.description.page | 110-112 | |
dc.identifier.isiut | NOT_IN_WOS | |
Appears in Collections: | Staff Publications |
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