Please use this identifier to cite or link to this item:
https://doi.org/10.1063/1.4862310
DC Field | Value | |
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dc.title | Phenomenological study of barrier imperfection and interfacial scattering on MgO based tunnel junctions | |
dc.contributor.author | Chen, B.J. | |
dc.contributor.author | Tan, S.G. | |
dc.date.accessioned | 2014-10-07T04:34:41Z | |
dc.date.available | 2014-10-07T04:34:41Z | |
dc.date.issued | 2014 | |
dc.identifier.citation | Chen, B.J., Tan, S.G. (2014). Phenomenological study of barrier imperfection and interfacial scattering on MgO based tunnel junctions. Journal of Applied Physics 115 (3) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.4862310 | |
dc.identifier.issn | 00218979 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/82889 | |
dc.description.abstract | We investigate the barrier imperfection and interfacial scattering effects on resistance-area product (RA) and tunneling magnetoresistance (TMR) of magnesium oxide (MgO) based magnetic tunneling junction (MTJ). We assume that barrier imperfection reduces the band gap of MgO; thus, it affects both TMR and RA values. The lattice mismatch between MgO and magnetic electrodes leads to interface scattering which reduces TMR. As an application, the MTJ two-state resistance variations due to the process variations are also discussed in the paper. © 2014 AIP Publishing LLC. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.4862310 | |
dc.source | Scopus | |
dc.type | Article | |
dc.contributor.department | ELECTRICAL & COMPUTER ENGINEERING | |
dc.description.doi | 10.1063/1.4862310 | |
dc.description.sourcetitle | Journal of Applied Physics | |
dc.description.volume | 115 | |
dc.description.issue | 3 | |
dc.description.page | - | |
dc.description.coden | JAPIA | |
dc.identifier.isiut | 000337296400001 | |
Appears in Collections: | Staff Publications |
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