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|Title:||Study of the microcracks on the alumina of the thin-film head||Authors:||Chekanov, A.S.
|Issue Date:||1995||Citation:||Chekanov, A.S.,Low, T.S.,Alli, S. (1995). Study of the microcracks on the alumina of the thin-film head. Proceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA : 176-180. ScholarBank@NUS Repository.||Abstract:||A study of the microcracks found in the alumina of the magnetic thin film head is presented. The initiation and growth of the crack was simulated. Thermal expansion of the energized wires was found to produce high stress at the pole tip area resulting in the cracks being attracted to the pole tips. Damages on the alumina act as crack initiation sites. The presence of the crack through the head gap also affects the recording performance of the head.||Source Title:||Proceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA||URI:||http://scholarbank.nus.edu.sg/handle/10635/72950|
|Appears in Collections:||Staff Publications|
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