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https://scholarbank.nus.edu.sg/handle/10635/72692
| Title: | Improved technique for measuring complex reflection coefficients of microwave devices using only two power detectors | Authors: | Yeo, S.P. Tay, S.T. |
Issue Date: | 1998 | Citation: | Yeo, S.P.,Tay, S.T. (1998). Improved technique for measuring complex reflection coefficients of microwave devices using only two power detectors. Conference Record - IEEE Instrumentation and Measurement Technology Conference 1 : 634-637. ScholarBank@NUS Repository. | Abstract: | The paper describes an improved technique for measuring the complex reflection coefficients of microwave devices using the four-port multi-state reflectometer (which requires two power detectors and other commonly-available laboratory components). Simulation and experimental tests have confirmed that the prototype instrument (implemented in waveguide form) is able to yield measurement accuracies of within ±0.01 for magnitude and ±1 ° for phase. | Source Title: | Conference Record - IEEE Instrumentation and Measurement Technology Conference | URI: | http://scholarbank.nus.edu.sg/handle/10635/72692 |
| Appears in Collections: | Staff Publications |
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