Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/72692
Title: Improved technique for measuring complex reflection coefficients of microwave devices using only two power detectors
Authors: Yeo, S.P. 
Tay, S.T.
Issue Date: 1998
Source: Yeo, S.P.,Tay, S.T. (1998). Improved technique for measuring complex reflection coefficients of microwave devices using only two power detectors. Conference Record - IEEE Instrumentation and Measurement Technology Conference 1 : 634-637. ScholarBank@NUS Repository.
Abstract: The paper describes an improved technique for measuring the complex reflection coefficients of microwave devices using the four-port multi-state reflectometer (which requires two power detectors and other commonly-available laboratory components). Simulation and experimental tests have confirmed that the prototype instrument (implemented in waveguide form) is able to yield measurement accuracies of within ±0.01 for magnitude and ±1 ° for phase.
Source Title: Conference Record - IEEE Instrumentation and Measurement Technology Conference
URI: http://scholarbank.nus.edu.sg/handle/10635/72692
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