Laser nano-engineering with the assistance of scanning probe microscope and optical resonance in microparticles

Abstract

A study on laser nano-engineering using scanning probe microscope and optical resonance in microparticles was presented. Optical and thermal processes of an STM junction under laser irradiation were described. A model for the near field of a tip under polarized laser irradiation was presented. Laser-induced nanooxidation was investigated on H-passivated p-type Ge and n-type Si surfaces under electrochemically etched tungsten STM tips in air ambient. Field emission scanning electron microscopy (SEM) was used to locate the black spots that were corresponding to the original particle position.