Please use this identifier to cite or link to this item:
https://doi.org/10.1109/TMTT.2010.2052407
Title: | Erratum: Analytical extraction of extrinsic and intrinsic FET parameters (IEEE Transactions on Microwave Theory and Techniques (2009) 57: 2 (254-261)) |
Authors: | Ooi, B.L. Zhong, Z. Leong, M.-S. |
Issue Date: | Aug-2010 |
Citation: | Ooi, B.L., Zhong, Z., Leong, M.-S. (2010-08). Erratum: Analytical extraction of extrinsic and intrinsic FET parameters (IEEE Transactions on Microwave Theory and Techniques (2009) 57: 2 (254-261)). IEEE Transactions on Microwave Theory and Techniques 58 (8) : 2314-. ScholarBank@NUS Repository. https://doi.org/10.1109/TMTT.2010.2052407 |
Source Title: | IEEE Transactions on Microwave Theory and Techniques |
URI: | http://scholarbank.nus.edu.sg/handle/10635/67927 |
ISSN: | 00189480 |
DOI: | 10.1109/TMTT.2010.2052407 |
Appears in Collections: | Staff Publications |
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