Please use this identifier to cite or link to this item: https://doi.org/10.1109/TMTT.2010.2052407
Title: Erratum: Analytical extraction of extrinsic and intrinsic FET parameters (IEEE Transactions on Microwave Theory and Techniques (2009) 57: 2 (254-261))
Authors: Ooi, B.L. 
Zhong, Z. 
Leong, M.-S. 
Issue Date: Aug-2010
Citation: Ooi, B.L., Zhong, Z., Leong, M.-S. (2010-08). Erratum: Analytical extraction of extrinsic and intrinsic FET parameters (IEEE Transactions on Microwave Theory and Techniques (2009) 57: 2 (254-261)). IEEE Transactions on Microwave Theory and Techniques 58 (8) : 2314-. ScholarBank@NUS Repository. https://doi.org/10.1109/TMTT.2010.2052407
Source Title: IEEE Transactions on Microwave Theory and Techniques
URI: http://scholarbank.nus.edu.sg/handle/10635/67927
ISSN: 00189480
DOI: 10.1109/TMTT.2010.2052407
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