Effects of using a metal layer in total internal reflection fluorescence microscopy

Please use this identifier to cite or link to this item: https://doi.org/10.1007/s00339-007-4119-1

Title:	Effects of using a metal layer in total internal reflection fluorescence microscopy
Authors:	Tang, W.T. Chung, E. Kim, Y. So, P.T.C. Sheppard, C.J.R.
Issue Date:	Nov-2007
Citation:	Tang, W.T., Chung, E., Kim, Y., So, P.T.C., Sheppard, C.J.R. (2007-11). Effects of using a metal layer in total internal reflection fluorescence microscopy. Applied Physics A: Materials Science and Processing 89 (2) : 333-335. ScholarBank@NUS Repository. https://doi.org/10.1007/s00339-007-4119-1
Abstract:	This proceeding examines the characteristics of imaging through a metal-coated glass cover slip using total internal reflection fluorescence microscopy (TIRFM). Through back and front focal plane imaging of sub-diffraction-limited fluorescent beads, the experimental characteristics of the emission are compared with theoretical simulations. Furthermore, at the angle at which surface plasmon resonance occurs, we show that the anisotropic emission of the fluorescent beads collected through the metal layer results in a irregular point spread function that has a donut-like structure with multiple concentric rings. © 2007 Springer-Verlag.
Source Title:	Applied Physics A: Materials Science and Processing
URI:	http://scholarbank.nus.edu.sg/handle/10635/67022
ISSN:	09478396
DOI:	10.1007/s00339-007-4119-1
Appears in Collections:	Staff Publications

There are no files associated with this item.

Check