Please use this identifier to cite or link to this item: https://doi.org/10.1007/s00339-007-4119-1
DC FieldValue
dc.titleEffects of using a metal layer in total internal reflection fluorescence microscopy
dc.contributor.authorTang, W.T.
dc.contributor.authorChung, E.
dc.contributor.authorKim, Y.
dc.contributor.authorSo, P.T.C.
dc.contributor.authorSheppard, C.J.R.
dc.date.accessioned2014-06-17T09:43:29Z
dc.date.available2014-06-17T09:43:29Z
dc.date.issued2007-11
dc.identifier.citationTang, W.T., Chung, E., Kim, Y., So, P.T.C., Sheppard, C.J.R. (2007-11). Effects of using a metal layer in total internal reflection fluorescence microscopy. Applied Physics A: Materials Science and Processing 89 (2) : 333-335. ScholarBank@NUS Repository. https://doi.org/10.1007/s00339-007-4119-1
dc.identifier.issn09478396
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/67022
dc.description.abstractThis proceeding examines the characteristics of imaging through a metal-coated glass cover slip using total internal reflection fluorescence microscopy (TIRFM). Through back and front focal plane imaging of sub-diffraction-limited fluorescent beads, the experimental characteristics of the emission are compared with theoretical simulations. Furthermore, at the angle at which surface plasmon resonance occurs, we show that the anisotropic emission of the fluorescent beads collected through the metal layer results in a irregular point spread function that has a donut-like structure with multiple concentric rings. © 2007 Springer-Verlag.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1007/s00339-007-4119-1
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentBIOENGINEERING
dc.description.doi10.1007/s00339-007-4119-1
dc.description.sourcetitleApplied Physics A: Materials Science and Processing
dc.description.volume89
dc.description.issue2
dc.description.page333-335
dc.description.codenAPAMF
dc.identifier.isiut000249016500018
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