Substructural identification method without interface measurement

Abstract

Substructural identification provides a novel means by which to reduce a large problem to smaller problems of manageable size, thereby improving numerical convergence and accuracy. Various methods proposed by several researchers thus far require interface response measurements, which are then treated as input to the substructures of concern. In practice, however, it is not always possible to obtain interface measurements, particularly if rotational response is required for beam/frame structures. In this paper, a method for parameter identification of substructures without the need of interface measurements is proposed. On the basis of receptance theory, an inverse problem is formulated in the frequency domain. Interface forces are eliminated by using different sets of measurements in the substructure concerned under the same dynamic excitation. The genetic algorithms approach is employed to determine the unknown parameters, and the fitness function is defined to minimize the difference between the estimates of interface forces obtained using different sets of response measurements. Three numerical examples are presented to illustrate the proposed method, and account for effects of measurement noise.