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|Title:||Extended depth of focus in a particle field measurement using a single-shot digital hologram||Authors:||Chen, W.
|Issue Date:||2009||Citation:||Chen, W., Quan, C., Tay, C.J. (2009). Extended depth of focus in a particle field measurement using a single-shot digital hologram. Applied Physics Letters 95 (20) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3263141||Abstract:||We propose a method to extend the depth of focus in a particle field measurement using a single-shot digital hologram. A focal plane is obtained for each pixel based on an entropy method, and a depth map is subsequently extracted. A synthesized extended focused image is determined correspondingly using the extracted depth map. In addition, a wavelet modulus maxima algorithm and Canny algorithm are further employed to detect the edges of each particle, and the sizes and a three-dimensional localization of the particles are also estimated. Preliminary results are presented to show the feasibility and effectiveness of the proposed technique. © 2009 American Institute of Physics.||Source Title:||Applied Physics Letters||URI:||http://scholarbank.nus.edu.sg/handle/10635/60266||ISSN:||00036951||DOI:||10.1063/1.3263141|
|Appears in Collections:||Staff Publications|
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