Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.3263141
Title: Extended depth of focus in a particle field measurement using a single-shot digital hologram
Authors: Chen, W. 
Quan, C. 
Tay, C.J. 
Issue Date: 2009
Source: Chen, W.,Quan, C.,Tay, C.J. (2009). Extended depth of focus in a particle field measurement using a single-shot digital hologram. Applied Physics Letters 95 (20) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3263141
Abstract: We propose a method to extend the depth of focus in a particle field measurement using a single-shot digital hologram. A focal plane is obtained for each pixel based on an entropy method, and a depth map is subsequently extracted. A synthesized extended focused image is determined correspondingly using the extracted depth map. In addition, a wavelet modulus maxima algorithm and Canny algorithm are further employed to detect the edges of each particle, and the sizes and a three-dimensional localization of the particles are also estimated. Preliminary results are presented to show the feasibility and effectiveness of the proposed technique. © 2009 American Institute of Physics.
Source Title: Applied Physics Letters
URI: http://scholarbank.nus.edu.sg/handle/10635/60266
ISSN: 00036951
DOI: 10.1063/1.3263141
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