Improved DSPI configuration for the inspection of components in the production line

Please use this identifier to cite or link to this item: https://doi.org/10.1007/BF00735536

Title:	Improved DSPI configuration for the inspection of components in the production line
Authors:	Ng, T.W.
Keywords:	Digital speckle pattern interferometry digital speckle shearing interferometry nondestructive inspection
Issue Date:	Jun-1995
Citation:	Ng, T.W. (1995-06). Improved DSPI configuration for the inspection of components in the production line. Journal of Nondestructive Evaluation 14 (2) : 77-81. ScholarBank@NUS Repository. https://doi.org/10.1007/BF00735536
Abstract:	In this paper, a digital speckle pattern interferometer configuration for the enhanced nondestructive inspection of components in the production line is presented. The setup used is adapted from the original design employed for digital speckle shearing interferometry. The theoretical principle behind the technique is outlined and its application in the detection of poor bolting in plates is demonstrated. © 1995 Plenum Publishing Corporation.
Source Title:	Journal of Nondestructive Evaluation
URI:	http://scholarbank.nus.edu.sg/handle/10635/58376
ISSN:	01959298
DOI:	10.1007/BF00735536
Appears in Collections:	Staff Publications

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