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Title: Whole-cell imaging at nanometer resolutions using fast and slow focused helium ions
Authors: Chen, X.
Udalagama, C.N.B. 
Chen, C.-B. 
Bettiol, A.A. 
Pickard, D.S. 
Venkatesan, T. 
Watt, F. 
Issue Date: 5-Oct-2011
Citation: Chen, X., Udalagama, C.N.B., Chen, C.-B., Bettiol, A.A., Pickard, D.S., Venkatesan, T., Watt, F. (2011-10-05). Whole-cell imaging at nanometer resolutions using fast and slow focused helium ions. Biophysical Journal 101 (7) : 1788-1793. ScholarBank@NUS Repository.
Abstract: Observations of the interior structure of cells and subcellular organelles are important steps in unraveling organelle functions. Microscopy using helium ions can play a major role in both surface and subcellular imaging because it can provide subnanometer resolutions at the cell surface for slow helium ions, and fast helium ions can penetrate cells without a significant loss of resolution. Slow (e.g., 10-50 keV) helium ion beams can now be focused to subnanometer dimensions (∼0.25 nm), and keV helium ion microscopy can be used to image the surfaces of cells at high resolutions. Because of the ease of neutralizing the sample charge using a flood electron beam, surface charging effects are minimal and therefore cell surfaces can be imaged without the need for a conducting metallic coating. Fast (MeV) helium ions maintain a straight path as they pass through a cell. Along the ion trajectory, the helium ion undergoes multiple electron collisions, and for each collision a small amount of energy is lost to the scattered electron. By measuring the total energy loss of each MeV helium ion as it passes through the cell, we can construct an energy-loss image that is representative of the mass distribution of the cell. This work paves the way to use ions for whole-cell investigations at nanometer resolutions through structural, elemental (via nuclear elastic backscattering), and fluorescence (via ion induced fluorescence) imaging. © 2011 Biophysical Society.
Source Title: Biophysical Journal
ISSN: 00063495
DOI: 10.1016/j.bpj.2011.08.028
Appears in Collections:Staff Publications

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