Please use this identifier to cite or link to this item:
https://doi.org/10.1002/mop.24330
| DC Field | Value | |
|---|---|---|
| dc.title | A "thru-short" method for noise de-embedding of mosfets | |
| dc.contributor.author | Nan, L. | |
| dc.contributor.author | Xiong, Y.-Z. | |
| dc.contributor.author | Mouthaan, K. | |
| dc.contributor.author | Issaoun, A. | |
| dc.contributor.author | Shi, J. | |
| dc.contributor.author | Ooi, B.-L. | |
| dc.date.accessioned | 2014-06-16T09:23:07Z | |
| dc.date.available | 2014-06-16T09:23:07Z | |
| dc.date.issued | 2009-05 | |
| dc.identifier.citation | Nan, L., Xiong, Y.-Z., Mouthaan, K., Issaoun, A., Shi, J., Ooi, B.-L. (2009-05). A "thru-short" method for noise de-embedding of mosfets. Microwave and Optical Technology Letters 51 (5) : 1379-1382. ScholarBank@NUS Repository. https://doi.org/10.1002/mop.24330 | |
| dc.identifier.issn | 08952477 | |
| dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/53878 | |
| dc.description.abstract | A "thru-short" noise de-embedding method for MOSFETs is presented. The capability of the "thru-short" method has been validated through a comparison of measured and de-embedded noise parameters using different methods. It is shown that the "thru-short" method is reliable for on-wafer de-embedding of both S-parameters and noise parameters up to 18 GHz. Noise contributions from the parasitics due to the contact pads and interconnections surrounding the MOSFET can be determined and removed accurately. © 2009 Wiley Periodicals, Inc. | |
| dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1002/mop.24330 | |
| dc.source | Scopus | |
| dc.subject | De-embedding | |
| dc.subject | MOSFET | |
| dc.subject | Noise parameters | |
| dc.type | Article | |
| dc.contributor.department | ELECTRICAL & COMPUTER ENGINEERING | |
| dc.description.doi | 10.1002/mop.24330 | |
| dc.description.sourcetitle | Microwave and Optical Technology Letters | |
| dc.description.volume | 51 | |
| dc.description.issue | 5 | |
| dc.description.page | 1379-1382 | |
| dc.description.coden | MOTLE | |
| dc.identifier.isiut | 000265248700067 | |
| Appears in Collections: | Staff Publications | |
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