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|Title:||Broadband complex permeability characterization of magnetic thin films using shorted microstrip transmission-line perturbation||Authors:||Liu, Y.
|Issue Date:||2005||Citation:||Liu, Y., Chen, L., Tan, C.Y., Liu, H.J., Ong, C.K. (2005). Broadband complex permeability characterization of magnetic thin films using shorted microstrip transmission-line perturbation. Review of Scientific Instruments 76 (6) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1935429||Abstract:||A brief review of the methods used for broadband complex permeability measurement of magnetic thin films up to microwave frequencies is given. In particular, the working principles of the transmission-line perturbation methods for the characterization of magnetic thin films are discussed, with emphasis on short-circuited planar transmission-line perturbation methods. The algorithms for calculating the complex permeability of magnetic thin films for short-circuited planar transmission-line perturbation methods are analyzed. A shorted microstrip line is designed and fabricated as a prototype measurement fixture. The structure of the microstrip fixture and the corresponding measurement procedure are discussed in detail. A piece of 340 nm thick FeTaN thin film deposited on Si substrate using sputtering method is characterized using the microstrip fixture. An improved technique for obtaining permeability by using a saturation magnetization field is demonstrated here, and the results fit well with the Landau-Lifchitz-Gilbert theory. Approaches to extending this method to other aspects in the investigation of magnetic thin film are also discussed. © 2005 American Institute of Physics.||Source Title:||Review of Scientific Instruments||URI:||http://scholarbank.nus.edu.sg/handle/10635/52812||ISSN:||00346748||DOI:||10.1063/1.1935429|
|Appears in Collections:||Staff Publications|
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