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https://scholarbank.nus.edu.sg/handle/10635/246475
| Title: | SINGLE IMPURITY TUNNELING CURRENT AND PHOTOCURRENT MEASUREMENT IN 2D MATERIAL BY CONDUCTIVE ATOMIC FORCE MICROSCOPY | Authors: | VU THANH TRUNG NAM | ORCID iD: |  orcid.org/0009-0002-7814-1180 |
Keywords: | 2D semiconductor, transition metal dichalcogenides, impurity doping, atomic force microscopy, resonant tunneling, photocurrent | Issue Date: | 27-Aug-2023 | Citation: | VU THANH TRUNG NAM (2023-08-27). SINGLE IMPURITY TUNNELING CURRENT AND PHOTOCURRENT MEASUREMENT IN 2D MATERIAL BY CONDUCTIVE ATOMIC FORCE MICROSCOPY. ScholarBank@NUS Repository. | URI: | https://scholarbank.nus.edu.sg/handle/10635/246475 |
| Appears in Collections: | Ph.D Theses (Closed) |
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