1. ScholarBank@NUS
  2. 2. Students
  3. ETD
  4. Ph.D Theses (Closed)
Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/246475
DC FieldValue
dc.titleSINGLE IMPURITY TUNNELING CURRENT AND PHOTOCURRENT MEASUREMENT IN 2D MATERIAL BY CONDUCTIVE ATOMIC FORCE MICROSCOPY
dc.contributor.authorVU THANH TRUNG NAM
dc.date.accessioned2023-12-18T18:00:20Z
dc.date.available2023-12-18T18:00:20Z
dc.date.issued2023-08-27
dc.identifier.citationVU THANH TRUNG NAM (2023-08-27). SINGLE IMPURITY TUNNELING CURRENT AND PHOTOCURRENT MEASUREMENT IN 2D MATERIAL BY CONDUCTIVE ATOMIC FORCE MICROSCOPY. ScholarBank@NUS Repository.
dc.identifier.urihttps://scholarbank.nus.edu.sg/handle/10635/246475
dc.language.isoen
dc.subject2D semiconductor, transition metal dichalcogenides, impurity doping, atomic force microscopy, resonant tunneling, photocurrent
dc.typeThesis
dc.contributor.departmentPHYSICS
dc.contributor.supervisorGoki Eda
dc.description.degreePh.D
dc.description.degreeconferredDOCTOR OF PHILOSOPHY (FOS)
dc.identifier.orcid0009-0002-7814-1180
Appears in Collections:Ph.D Theses (Closed)

Show simple item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.